Key indicators to monitor and benchmark R&D activities in China : a comparative empirical and literature analysis
Year of publication: |
2010
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Authors: | Helfenstein, Markus ; Steinert, Martin |
Published in: |
International journal of technology, policy and management : IJTPM. - Olney, Bucks. : Inderscience Enterprises, ISSN 1468-4322, ZDB-ID 2113290-2. - Vol. 10.2010, 3, p. 258-283
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Subject: | NXP Semiconductors | Multinationales Unternehmen | Transnational corporation | Industrieforschung | Industrial research | Betriebliche Kennzahl | Financial ratio | Internationaler Markteintritt | International market entry | Halbleiterindustrie | Semiconductor industry | China |
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