R&D and Patents: Which Way Does the Causality Run?
Year of publication: |
2001-04-01
|
---|---|
Authors: | Brouwer, Erik ; Kleinknecht, Alfred ; Mohnen, Pierre ; Ophem, Hans van |
Institutions: | Centre Interuniversitaire de Recherche en Analyse des Organisations (CIRANO) |
Subject: | Innovation survey data | patents | R&D | count data | Enquêtes innovation | brevets | R-D | données de comptage |
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