A broader view of the economic design of the X-bar chart in the semiconductor industry
B. Baud-Lavigne, S. Bassetto and B. Penz
| Year of publication: |
2010
|
|---|---|
| Authors: | Baud-Lavigne, Bertrand ; Bassetto, Samuel Jean ; Penz, Bernard |
| Published in: |
International journal of production research. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 160477-6. - Vol. 48.2010, 19/20 (1/15.10.), p. 5843-5857
|
| Subject: | Halbleiterindustrie | Semiconductor industry | Statistische Qualitätskontrolle | Statistical quality control | Simulation |
| Extent: | graph. Darst. |
|---|---|
| Type of publication: | Article |
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10008652324