A double-frontier approach for measuring market imperfection
| Year of publication: |
2010
|
|---|---|
| Authors: | Mouchart, Michel ; Vandresse, Marie |
| Published in: |
Annals of operations research. - New York, NY [u.a.] : Springer Science + Business Media, ISSN 0254-5330, ZDB-ID 2526293. - Vol. 173.2010, 1, p. 137-145
|