A fast wavelet approach for recovering damaged images
Year of publication: |
2008
|
---|---|
Authors: | Kim, Donghoh ; Lee, Youngjo ; Oh, Hee-Seok |
Published in: |
Journal of Applied Statistics. - Taylor & Francis Journals, ISSN 0266-4763. - Vol. 35.2008, 8, p. 927-938
|
Publisher: |
Taylor & Francis Journals |
Subject: | binning process | imputation | missing pixel | perturbed location | scattered data | wavelet shrinkage |
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