A framework for inspection of dies attachment on PCB utilizing machine learning techniques
Year of publication: |
June 2018
|
---|---|
Authors: | Vafeiadis, Thanasis ; Dimitriou, Nikolaos ; Ioannidis, Dimosthenis ; Wotherspoon, Tracy ; Tinker, Gregory ; Tzovaras, Dimitrios |
Published in: |
Journal of management analytics. - Abingdon, Oxon : Taylor & Francis, ISSN 2327-0012, ZDB-ID 2896673-9. - Vol. 5.2018, 2, p. 81-94
|
Subject: | PCB | image processing | feature extraction | machine learning | Monte Carlo | Künstliche Intelligenz | Artificial intelligence | Theorie | Theory |
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