A Generalized KPSS Measure of Patent Value
Year of publication: |
[2021]
|
---|---|
Authors: | Dong, Zhiqiang ; Lu, Yunzhi ; Meng, Qingxin |
Publisher: |
[S.l.] : SSRN |
Subject: | Patent | Messung | Measurement | Theorie | Theory | Bewertung | Evaluation | Patentrecht | Patent law |
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