A neural network based model for abnormal pattern recognition of control charts
Year of publication: |
1999
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Authors: | Guh, Ruey-Shy ; Hsieh, Yi-Chih |
Published in: |
Computers & industrial engineering : CAIE ; an internat. journal. - Amsterdam [u.a.] : Elsevier, ISSN 0360-8352, ZDB-ID 1969936. - Vol. 36.1999, 1, p. 97-108
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