A periodic review inventory model subject to shrinkage type errors : impact of RFID
Yacine Rekik; Zied Jemai
| Year of publication: |
2009
|
|---|---|
| Authors: | Rekik, Yacine ; Jemai, Zied |
| Published in: |
International journal of electronic business. - Olney, Bucks. : Inderscience Publ., ISSN 1470-6067, ZDB-ID 21063278. - Vol. 7.2009, 1, p. 68-85
|
| Extent: | graph. Darst. |
|---|---|
| Type of publication: | Article |
| Language: | English |
| Source: |
Persistent link: https://www.econbiz.de/10009851615