A simple method for the determination of strains in epitaxial films: application to Eu(110) deposited on a Nb(110) buffer

In order to determine the strain tensor in a 375 nm thick Eu(110) epitaxial thin film, we have developed a new method, based on the accurate determination of the lattice vectors by high resolution X-ray diffraction. We show that a biaxial strain model gives a good representation of the state of the strains field in the film. Copyright EDP Sciences/Società Italiana di Fisica/Springer-Verlag 2005

MoreLess

Year of publication:	2005
Authors:	Soriano, S. ; Gourieux, T. ; Stunault, A. ; Dumesnil, K. ; Dufour, C.
Published in:	The European Physical Journal B - Condensed Matter and Complex Systems. - Springer. - Vol. 48.2005, 2, p. 167-171
Publisher:	Springer

Online Resource

Check full text access |

More access options

Check Google Scholar

In German libraries (KVK)

I need help

More details

Extent:	text/html
Type of publication:	Article
Source:	RePEc - Research Papers in Economics

Persistent link: https://www.econbiz.de/10009280131