A unified model incorporating yield, burn-in, and reliability
| Year of publication: |
2004
|
|---|---|
| Authors: | Kim, Kyungmee O. ; Kuo, Way |
| Published in: |
Naval research logistics : an international journal. - New York, NY : Wiley, ISSN 0894-069X, ZDB-ID 3924944. - Vol. 51.2004, 5, p. 704-719
|