A Unifying Family of Group Sequential Test Designs
| Year of publication: |
1999
|
|---|---|
| Authors: | Kittelson, John M. ; Emerson, Scott S. |
| Published in: |
Biometrics. - The International Biometric Society. - Vol. 55.1999, 3, p. 874-882
|
| Publisher: |
The International Biometric Society |
| Extent: | text/html |
|---|---|
| Type of publication: | Article |
| Source: |
Persistent link: https://ebvufind01.dmz1.zbw.eu/10010948440