ACCELERATED TESTING & SCREENING - Step-stress life-testing with random stress-change times for exponential data
| Year of publication: |
1999
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|---|---|
| Authors: | Xiong, C. ; Milliken, G. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 48.1999, 2, p. 141-148
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