Accuracy Analysis of the Estimated Process Yield Based on Spk
| Year of publication: |
2004
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|---|---|
| Authors: | Pearn, W.L. ; Chuang, C.C. |
| Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 20.2004, 4, p. 305-316
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