An effective and efficient defect inspection system for TFT-LCD polarised films using adaptive thresholds and shape-based image analyses
| Year of publication: |
2010
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|---|---|
| Authors: | Noh, Chung-Ho ; Lee, Seok-Lyong ; Kim, Deok-Hwan ; Chung, Chin-Wan ; Kim, Sang-Hee |
| Published in: |
International journal of production research : American Institute of Industrial Engineers ; Society of Manufacturing Engineers. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 1604776. - Vol. 48.2010, 17, p. 5115-5136
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