An effective and efficient defect inspection system for TFT-LCD polarised films using adaptive thresholds and shape-based image analyses
Chung-Ho Noh, Seok-Lyong Lee, Deok-Hwan Kim, Chin-Wan Chung and Sang-Hee Kim
| Year of publication: |
2010
|
|---|---|
| Authors: | Noh, Chung-ho ; Lee, Seok-lyong ; Kim, Deok-hwan ; Chung, Chin-wan ; Kim, Sang-hee |
| Published in: |
International journal of production research. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 160477-6. - Vol. 48.2010, 17/18 (1/15.9.), p. 5115-5135
|
| Subject: | Fließfertigung | Assembly-line production | Flüssigkristallanzeige | Liquid cristal display | Statistische Qualitätskontrolle | Statistical quality control | Experiment | Theorie | Theory |
| Extent: | Ill., graph. Darst. |
|---|---|
| Type of publication: | Article |
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10009125446