An effective defect inspection system for polarized film images using image segmentation and template matching techniques
| Year of publication: |
2008
|
|---|---|
| Authors: | Yoon, Young-Geun ; Lee, Seok-Lyong ; Chung, Chin-Wan ; Kim, Sang-Hee |
| Published in: |
Computers & industrial engineering : CAIE ; an internat. journal. - Amsterdam [u.a.] : Elsevier, ISSN 0360-8352, ZDB-ID 1969936. - Vol. 55.2008, 3, p. 567-584
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