An empirical process to derive OSS defect estimation models
Year of publication: |
2011
|
---|---|
Authors: | Xu, Jie ; Capretz, Luiz Fernando ; Ho, Danny |
Published in: |
The International Journal of Management Science and Information Technology (IJMSIT). - Toronto : NAISIT Publishers, ISSN 1923-0273. - 2011, 1-(Jul-Sep), p. 1-26
|
Publisher: |
Toronto : NAISIT Publishers |
Subject: | software quality | quality estimation | software metrics | regression | neurazl networks | fuzzy logic |
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