An Examination of Some Switching Procedures Used in Sampling Inspection

It is shown that the quick switching system, tightened normal tightened scheme and other switching systems emerge from the generalised two‐plan system involving normal and tightened inspection. The corresponding operating characteristic (OC) functions are also shown to emerge from generalised results. The performance of different systems compared with reference to their OC curves. The possibility of being applied in a critical area of application (in which the single sampling plans are not possible to apply) is indicated.