An inference method for temperature step-stress accelerated life testing
| Year of publication: |
2001
|
|---|---|
| Authors: | Gouno, E. |
| Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 17.2001, 1, p. 11-18
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