An optimal rule for patent damages under sequential innovation
| Year of publication: |
2018
|
|---|---|
| Authors: | Chen, Yongmin ; Sappington, David E.M. |
| Published in: |
The RAND Journal of Economics. - Wiley, ISSN 0741-6261, ZDB-ID 2025174-9. - Vol. 49.2018, 2 (02.05.), p. 370-397
|
| Publisher: |
Wiley |
| Type of publication: | Article |
|---|---|
| Language: | English |
| Other identifiers: | 10.1111/1756-2171.12229 [DOI] |
| Source: | Other ZBW resources |
Persistent link: https://www.econbiz.de/10012086638