Analysing inspection frequency for wafer bumping process and an empirical study of UNISON decision framework
Chen-Fu Chien; Chih-Han Hu; Chi-Yung Lin
| Year of publication: |
2008
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|---|---|
| Authors: | Chien, Chen-Fu ; Hu, Chih-Han ; Lin, Chi-Yung |
| Published in: |
International journal of manufacturing technology and management. - Milton Keynes [u.a.] : Inderscience Enterprises, ISSN 1368-2148, ZDB-ID 20374021. - Vol. 14.2008, 1/2, p. 130-144
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| Extent: | graph. Darst. |
|---|---|
| Type of publication: | Article |
| Language: | English |
| Source: |
Persistent link: https://ebvufind01.dmz1.zbw.eu/10009873053