Applying neural network approach to achieve robust design for dynamic quality characteristics
Year of publication: |
1998
|
---|---|
Authors: | Su, Chao‐Ton ; Hsieh, Kun‐Lin |
Published in: |
International Journal of Quality & Reliability Management. - MCB UP Ltd, ISSN 1758-6682, ZDB-ID 1466792-7. - Vol. 15.1998, 5, p. 509-519
|
Publisher: |
MCB UP Ltd |
Subject: | Design | Neural networks | Quality control | Semiconductors | Taguchi methods |
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