Battling counterfeit masks during the COVID-19 outbreak : quality inspection vs. blockchain adoption
Year of publication: |
2023
|
---|---|
Authors: | Shen, Bin ; Cheng, Ming ; Dong, Ciwei ; Xiao, Yixuan |
Published in: |
International journal of production research. - London [u.a.] : Taylor & Francis, ISSN 1366-588X, ZDB-ID 1485085-0. - Vol. 61.2023, 11, p. 3634-3650
|
Subject: | Blockchain | COVID-19 | inspection | mask | supply chain | Lieferkette | Supply chain | Coronavirus | Infektionsschutz | Infection control | Qualitätsmanagement | Quality management |
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