Bias-corrected realized variance under dependent microstructure noise
Year of publication: |
2011
|
---|---|
Authors: | Oya, Kosuke |
Published in: |
Mathematics and Computers in Simulation (MATCOM). - Elsevier, ISSN 0378-4754. - Vol. 81.2011, 7, p. 1290-1298
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Publisher: |
Elsevier |
Subject: | Realized variance | Dependent microstructure noise | Two time scales |
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