Bias-Correcting the Realized Range-Based Variance in the Presence of Market Microstructure Noise
Year of publication: |
2006
|
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Authors: | Christensen, Kim ; Podolskij, Mark ; Vetter, Mathias |
Institutions: | Institut für Wirtschafts- und Sozialstatistik, Universität Dortmund |
Subject: | Bias-Correction | Integrated Variance | Market Microstructure Noise | Realized Range-Based Variance | Realized Variance |
Extent: | application/pdf |
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Series: | |
Type of publication: | Book / Working Paper |
Language: | English |
Notes: | Number 2006,52 |
Classification: | C10 - Econometric and Statistical Methods: General. General ; C80 - Data Collection and Data Estimation Methodology; Computer Programs. General ; C22 - Time-Series Models |
Source: |
-
Bias-Correcting the Realized Range-Based Variance in the Presence of Market Microstructure Noise
Christensen, Kim, (2006)
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