Circuit Component Degradation - A Generalized SSI Reliability Model Considering Stochastic Loading and Strength Aging Degradation
| Year of publication: |
2004
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|---|---|
| Authors: | Huang, W. ; Askin, R.G. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 53.2004, 1, p. 77-82
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