Close to you? : bias and precision in patent-based measures of technological proximity
Year of publication: |
2008
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Authors: | Benner, Mary ; Waldfogel, Joel |
Published in: |
Research policy : policy, management and economic studies of science, technology and innovation. - Amsterdam [u.a.] : Elsevier, ISSN 0048-7333, ZDB-ID 121149-3. - Vol. 37.2008, 9, p. 1556-1567
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Subject: | Industrieforschung | Industrial research | Innovation | Patent | Wissenstransfer | Knowledge transfer | Innovationsdiffusion | Innovation diffusion | Messung | Measurement | Fotoindustrie | Photographic industry | USA | United States | 1980-2002 |
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