Comment on: A general linear-regression analysis applied to the 3-parameter Weibull distribution
| Year of publication: |
1997
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| Authors: | Jiang, R. ; Murthy, D. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 46.1997, 3, p. 389-392
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