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Modeling repair events under intermittent failures and failures subject to unsuccessful repair
Hansen, C.K., (2002)
Modelling and Estimation of Wafer Yields and Defect Densities from Microelectronics Test Structure Data
Hansen, C.K., (1996)
A Full History Proportional Hazards Model for Preventive Maintenance Scheduling
Kobbacy, K.A.H., (1997)