Competing Risks Analysis of Correlated Failure Time Data
| Year of publication: |
2008
|
|---|---|
| Authors: | Chen, Bingshu E. ; Kramer, Joan L. ; Greene, Mark H. ; Rosenberg, Philip S. |
| Published in: |
Biometrics. - The International Biometric Society. - Vol. 64.2008, 1, p. 172-179
|
| Publisher: |
The International Biometric Society |
| Extent: | text/html |
|---|---|
| Type of publication: | Article |
| Source: |
Persistent link: https://www.econbiz.de/10010948394