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Degradation pattern prediction of a polymer electrolyte membrane fuel cell stack with series reliability structure via durability data of single cells
Bae, Suk Joo, (2014)
Multi-step ART1 algorithm for recognition of defect patterns on semiconductor wafers
Choi, Gyunghyun, (2012)
Yield prediction via spatial modeling of clustered defect counts across a wafer map
Bae, Suk Joo, (2007)