Credit Risk Assessment Considering Variations in Exposure: Application to Commitment Lines
Year of publication: |
2008-02
|
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Authors: | Fujiwara, Shigeaki |
Institutions: | Institute for Monetary and Economic Studies, Bank of Japan |
Subject: | : Commitment lines | Probability of default | Loss given default | Exposure at default | Expected loss | Unexpected loss |
Extent: | application/pdf |
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Series: | |
Type of publication: | Book / Working Paper |
Language: | English |
Notes: | Number 08-E-03 |
Classification: | G21 - Banks; Other Depository Institutions; Mortgages ; G32 - Financing Policy; Capital and Ownership Structure ; G33 - Bankruptcy; Liquidation |
Source: |
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Credit Risk Assessment Considering Variations in Exposure: Application to Commitment Lines
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