Critical acceptance values and sample sizes of a variables sampling plan for very low fraction of defectives
Year of publication: |
2006
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Authors: | Pearn, W.L. ; Wu, Chien-Wei |
Published in: |
Omega : the international journal of management science. - Oxford [u.a.] : Elsevier, ISSN 0305-0483, ZDB-ID 1245028. - Vol. 34.2006, 1, p. 90-101
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