Criticality index analysis based optimal RFID reader placement models for asset tracking
Year of publication: |
2010
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Authors: | Osman, Mojahid Saeed ; Ram, Bala ; Stanfield, Paul ; Samanlioglu, Funda ; Davis, Lauren ; Bhadury, Joy |
Published in: |
International journal of production research : American Institute of Industrial Engineers ; Society of Manufacturing Engineers. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 1604776. - Vol. 48.2010, 9, p. 2679-2699
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