Decisions on an Optimal Life Test Sampling Plan With Warranty Considerations
| Year of publication: |
2008
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|---|---|
| Authors: | Huang, Y.-S. ; Hsieh, C.-H. ; Ho, J.-W. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 57.2008, 4, p. 643-649
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