Design and evaluation of skip-lot sampling inspection plans with double-sampling plan as the reference plan
This paper presents a design for skip-lot sampling inspection plans with the double-sampling plan as the reference plan, so as to reduce the sample size and produce more efficient plans in return for the same sampling effort. The efficiency of the proposed plan compared with that of the conventional double-sampling plan is also discussed. The need for smaller acceptance numbers under the plan is highlighted. Methods of selecting the plan indexed by the acceptable quality level and limiting quality level, and by the acceptable quality level and average outgoing quality level are also presented.
Year of publication: |
1998
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Authors: | Vijayaraghavan, R. ; Soundararajan, V. |
Published in: |
Journal of Applied Statistics. - Taylor & Francis Journals, ISSN 0266-4763. - Vol. 25.1998, 3, p. 341-348
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Publisher: |
Taylor & Francis Journals |
Saved in:
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