Design of EWMA and CUSUM control charts subject to random shift sizes and quality impacts
| Year of publication: |
2007
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|---|---|
| Authors: | Chen, Argon ; Chen, Y.K. |
| Published in: |
IIE transactions / Institute of Industrial Engineers, Norcross, Ga : industrial engineering and development. - Philadelphia, Pa : Taylor & Francis, ISSN 0569-5554, ZDB-ID 2460191. - Vol. 39.2007, 12, p. 1127
|