Designing a yield-based skip-lot sampling plan for lot acceptance determination
Year of publication: |
2022
|
---|---|
Authors: | Wu, Chien-wei ; Chen, Jr-Tzung ; Liu, Shih-Wen |
Published in: |
Journal of the Operational Research Society. - London : Taylor and Francis, ISSN 1476-9360, ZDB-ID 2007775-0. - Vol. 73.2022, 3, p. 653-663
|
Subject: | average sample number | lot sentencing | operating characteristic function | process yield | Skip-lot sampling | Stichprobenerhebung | Sampling | Theorie | Theory | Produktionsplanung | Production planning | Losgröße | Lot size |
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