Diagnostic Characteristics for Bivariate Pattern Recognition Scheme in SPC
| Year of publication: |
1994
|
|---|---|
| Authors: | Chih, Wenhai W. ; Rollier, Dwayne A. |
| Published in: |
International journal of quality & reliability management. - Bradford : Emerald, ISSN 0265-671X, ZDB-ID 517872. - Vol. 11.1994, 1, p. 53-66
|