DISTRIBUTIONS - PROBABILITY AND STATISTICAL-INFERENCE - A failure-time model for infant-mortality and wearout failure-modes
| Year of publication: |
1999
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|---|---|
| Authors: | Chan, V. ; Meeker Jr, W. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 48.1999, 4, p. 377-387
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