Do external risk factors increase or decrease country-level R&D efficiency : focused on air pollution and job insecurity?
Sangpil Yoon, Yanghon Chung, Seunghun Han, Chungwon Woo
| Year of publication: |
2024
|
|---|---|
| Authors: | Yoon, Sangpil ; Chung, Yanghon ; Han, Seunghun ; Woo, Chungwon |
| Published in: |
Technology analysis & strategic management. - London : Taylor & Francis Group, ISSN 1465-3990, ZDB-ID 1485021-7. - Vol. 36.2024, 3, p. 472-485
|
| Subject: | air pollution | DEA-Tobit | job insecurity | R&D efficiency | Luftverschmutzung | Air pollution | Beschäftigungssicherung | Job security | Risiko | Risk | Theorie | Theory | Effizienz | Efficiency |
| Type of publication: | Article |
|---|---|
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Other identifiers: | 10.1080/09537325.2022.2036715 [DOI] |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10014557727