Effective recognition of control chart patterns in autocorrelated data using a support vector machine based approach
| Year of publication: |
2011
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|---|---|
| Authors: | Lin, Shih-Yen ; Guh, Ruey-Shiang ; Shiue, Yeou-Ren |
| Published in: |
Computers & industrial engineering : CAIE ; an internat. journal. - Amsterdam [u.a.] : Elsevier, ISSN 0360-8352, ZDB-ID 1969936. - Vol. 61.2011, 4, p. 1123-1135
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