Estimating Long and Short Run Effects in Static Panel Models
| Year of publication: |
2005
|
|---|---|
| Authors: | Egger, Peter ; Pfaffermayr, Michael |
| Published in: |
Econometric Reviews. - Taylor & Francis Journals, ISSN 0747-4938. - Vol. 23.2005, 3, p. 199-214
|
| Publisher: |
Taylor & Francis Journals |
| Subject: | Short run effects | Long run effects | Small sample bias | Panel econometrics |
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