Estimating process yield based on <i>S<sub>pk<-sub><-i> for multiple samples
| Year of publication: |
2007
|
|---|---|
| Authors: | Pearn, W.L. ; Cheng, Ya Ching |
| Published in: |
International journal of production research : American Institute of Industrial Engineers ; Society of Manufacturing Engineers. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 1604776. - Vol. 45.2007, 1, p. 49-64
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