Estimation - Optimal Step-Stress Test Under Progressive Type-I Censoring
| Year of publication: |
2004
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|---|---|
| Authors: | Gouno, E. ; Sen, A. ; Balakrishnan, N. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 53.2004, 3, p. 388-393
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