Evaluation of heuristics for a class-constrained lot-to-order matching problem in semiconductor manufacturing
| Year of publication: |
2008
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|---|---|
| Authors: | Boushell, Thomas ; Fowler, John ; Keha, Ahmet ; Knutson, Kraig ; Montgomery, Douglas |
| Published in: |
International journal of production research : American Institute of Industrial Engineers ; Society of Manufacturing Engineers. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 1604776. - Vol. 46.2008, 12, p. 3143-3166
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