Exact tests for the rasch model via sequential importance sampling
| Year of publication: |
2005
|
|---|---|
| Authors: | Chen, Yuguo ; Small, Dylan |
| Published in: |
Psychometrika. - Springer. - Vol. 70.2005, 1, p. 11-30
|
| Publisher: |
Springer |
| Subject: | Rasch model | exact tests | goodness of fit tests | Monte Carlo methods | sequential importance sampling |
| Extent: | text/html |
|---|---|
| Type of publication: | Article |
| Source: |
Persistent link: https://www.econbiz.de/10005603638