Expected warranty cost of two-attribute free-replacement warranties based on a bivariate exponential distribution
| Year of publication: |
2000
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|---|---|
| Authors: | Kim, H.-G. ; Rao, B.M. |
| Published in: |
Computers & industrial engineering : CAIE ; an internat. journal. - Amsterdam [u.a.] : Elsevier, ISSN 0360-8352, ZDB-ID 1969936. - Vol. 38.2000, 4, p. 425-434
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