Exploring the nonlinear effects of patent H index, patent citations, and essential technological strength on corporate performance by using artificial neural network
Year of publication: |
2012
|
---|---|
Authors: | Zhang, Sifei ; Yuan, Chien-Chung ; Chang, Ke-Chiun ; Ken, Yun |
Published in: |
Journal of Informetrics. - Elsevier, ISSN 1751-1577. - Vol. 6.2012, 4, p. 485-495
|
Publisher: |
Elsevier |
Subject: | Patent citations | H index | Essential technological strength |
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